SunVTS 2.1.3 Test Reference Manual
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CHAPTER 24

NVRAM Card Test (nvtest)


nvtest tests the SBus NVRAM card. During the probe phase, it attempts to open all /dev/nvramX devices. If successful, it makes an ioctl (NVRAMIOCGETINFO) call to determine that the card size is non-zero and makes an entry under "Other devices" for that instance of the card.
nvtest performs the following actions:
  1. Opens the device

  2. Uses the ioctl (NVRAMIOCGETINFO) call to determine the size of the available memory to be tested.

  3. Uses the ioctl (NVRAMIOCGETREGS) call to determine whether all the batteries are connected and not low on voltage. This call also verifies that the board is not in a "dirty" state. The test aborts if the dirty state is true or if a battery problem is detected.

  4. Starts the memory test which consists of:

  • mapping the memory board to the user address space.
  • checking the functionality of the EDC (error detection & correction unit) In this phase, the board is put in the checkbit injection mode and the checkbits are written corresponding to an error in bit 0 through 63. The data is read back to verify that the bits in error were corrected. The syndrome bits are also checked to make sure they were generated correctly. In addition to the 64 bits of data, the error correction for the 8 checkbits are also verified.
  • performing write-read-compare tests once the board is set to normal mode with parity checking enabled. The write-read-compare is done in byte, short, long, long and 64 bit burst modes. The number selected to test burst mode is a sequential number, and patterns 0xaa and 0x55 are used to test the long burst mode.
  • examining the diagnostic register for single-bit and multi-bit errors while the board is set to diagnostic output mode.
  • clearing the diagnostic registers, returning the board to normal mode with parity checking enabled, setting all the memory to zero using the NVRAMIOCZAP ioctl call, and unmapping the memory board.

Note - In normal mode the error checking and correction is enabled.


nvtest Options

nvtest does not have options.

nvtest Test Modes

nvtest only supports offline mode since the test is intrusive. It is a non-scalable test because simultaneously writing to the same memory will cause the test to fail.

nvtest Command Line Syntax

/opt/SUNWvts/bin/nvtest standard_arguments -o dev=device

TABLE 24-1 nvtest
ArgumentExplanation
dev=devicedevice is the name of the device being tested such as nvram0

nvtest Error Messages

TABLE 24-2 nvtest
Error MessageProbable Cause(s)Recommended Action
6000 string

6001 Nvmem ioctl failed: command

6002 Nvmem ECC multibit error

6003 Nvmem ECC single-bit error

6004 byte compare: location = number, observed = number, expected = numberOn-board memory error.Contact your authorized Sun Service provider.
6005 word compare: location = number, observed = number, expected = numberOn-board memory error.Contact your authorized Sun Service provider.
6006 long compare: location = number, observed = number, expected

d = number

On-board memory error.Contact your authorized Sun Service provider.
6007 lseek() failed: error message

6008 NVRAM write failed: error message

6009 NVRAM read failed:error message

6010 Failed to mmap nvmem: error message

6011 Failed to munmap nvmem: error message

6012 Failed to mmap nvmem:error message

6013 Failed to munmap
nvmem:error message


TABLE 24-2 nvtest(Continued)
Error MessageProbable Cause(s)Recommended Action
6014 Nvmem ECC error count is non-zero

6016 Data compare failed.

6018 Nvmem test is applicable in Offline mode only

6019 NVMEM battery 1 voltage is lowBattery.Contact your authorized Sun service provider.
6020 NVMEM battery 1 is disabledBattery may not be jumpered correctly.Please refer to the hardware manual for instructions for connecting the battery jumper. If the problem persists, contact your authorized Sun service provider.
6021 Nvmem battery 2 voltage is lowBattery.Contact your authorized Sun Service provider.
6022 Nvmem battery 2 is disabledBattery may not be jumpered correctly.Please refer to the hardware manual for instructions for connecting the battery jumper. If the problem persists, contact your authorized Sun service provider.
6023 Nvmem battery 3 voltage is lowBattery.Contact your authorized Sun Service provider.
6024 Nvmem battery 3 is disabledBattery may not be jumpered correctly.Please refer to the hardware manual for instructions for connecting the battery jumper. If the problem persists, contact your authorized Sun service provider.
6025 Nvmem battery 4 voltage is loBattery.Contact your authorized Sun Service provider.
6026 Nvmem battery 4 is disabledBattery may not be jumpered correctly.Please refer to the hardware manual for instructions for connecting the battery jumper. If the problem persists, contact your authorized Sun service provider.
6027 Nvmem ECC multibit errorOn-board memory error.Contact your authorized Sun service provider.
TABLE 24-2 nvtest(Continued)

Error MessageProbable Cause(s)Recommended Action
6028Nvmem ECC single-bit errorOn-board memory error.Contact your authorized Sun service provider.
6029Nvmem ECC error count is non-zero!On-board memory error.Contact your authorized Sun service provider.
6030vmem ECC Diagnostic Registers

num of errors = number error type = number Last ckbit = number Last syndrome = number First ckbit = number First syndrome = number

On-board memory error.Contact your authorized Sun service provider.
6031Nvmem: valloc failed, skipping burst mode test

6032Nvmem: EDC test failed in bitno number

corrected data sbe: number data is:number

On-board memory error.Contact your authorized Sun service provider.
6033Nvmem: EDC test failed in bitno: number syndrome sbe:number is:number

checkbits sbe:number is:number

On-board memory error.Contact your authorized Sun service provider.
8000string

8001Failed to open nvmem board: device

8003Battery Error

8004memory_check (pass number) failed

8005The board is dirty, exit memory test

8008Open directory failed: error Please enter test file directory