CHAPTER 28

Environmental Sensing Card Test (sentest)

sentest checks the SCSI Environmental Sensing card (SEN) installed in the SPARCstorage RSM to monitor the enclosure environment. The SEN card monitors the enclosure's over-temperature condition, fan-failures, power-supply failures, and drive activity.

sentest verifies the SEN card by first setting each control function to a predetermined value, and then reading it back to verify if the value is correct.

sentest verifies the following control functions in the enclosure:

• Alarm (enable/disable): sentest toggles the alarm to the disable state, then to the enable state.
• Alarm time (0-0xff seconds): sentest sets the time (from 0 to 4095), then reads it back to verify the time setting.
• Drive fault LED (DL0-DL6): sentest toggles each LED to its OFF and ON states.

sentest is a nonscalable test. It cannot verify the setting correctly if another instance is changing the setting.

sentest Options

FIGURE 28-1 sentest

TABLE 28-1 sentest

sentest Options	Description
Test Type	Specifies the test to be performed. Norm test type performs normal testing as alarm enable/disable, alarm time setting, and drive LED on/off testing; Interactive test type reports the current enclosure status.
Enc_state	Specifies which subsystem's status in the enclosure is reported. Default is ALL. This test is only used with the inter test type and in Functional test. The test options are: ·Alarm enable/disable status ·Drive present status ·Drive LED status ·Power modules status ·Fan modules status ·Over temperature, abs (abnormal, no immediate attention needed), chk (abnormal, immediate attention needed) status ·All of the above

sentest Test Modes

sentest supports all three modes. Each mode performs a different test scheme on the SEN card.

TABLE 28-2 sentest

Test Mode	Description
Connection Test	Checks the device connection by opening the device. If the device does not open, the device is not connected.
Functional Test	Checks three components within the enclosure. It checks alarm enable/disable, alarm time setting, and the drive's LEDs. It does not test the power on/off function (only functions whose values can be changed are tested) If you invoke SunVTS through SyMON, the following Functional Test description applies: Opens the device and reports the current enclosure status

sentest Command Line Syntax

/opt/SUNWvts/bin/sentest [standard arguments] -o dev=interface,[test=type],[enc=component]

TABLE 28-3 sentest

Argument	Explanation
dev=interface	SEN card device name; the default value is ses0.
test=type	Specifies the test type; select Norm for normal testing or Inter for interactive testing; the default value is Norm.Possible values are: norm and inter
enc=component	Indicates which part of the enclosure status is reported; the default value is ALL. Possible values are: enalm, dp, dl, pm, fan, ovt, and ALL

sentest Error Messages

TABLE 28-4 sentest

Error Message		Probable Cause(s)	Recommended Action
6000	Check alenb failed, exp=<value>, obs=<value>
6001	Check alenb failed, exp=<value>, obs=<value>
6002	Check alenb failed, exp=<value>, obs=<value>
6003	Check altime failed, exp time=<value>, obs=<value>
6004	Fan failed
6005	Dual fan failed
6006	Enclosure over temperature

TABLE 28-4 sentest(Continued)

Error Message		Probable Cause(s)	Recommended Action
6007	Device failed, need immediate attention
6008	Power module A failed
6009	power module B failed
8000	power module B failed
8001	ioctl get state failed, errmsg=<message>
8002	ioctl get state failed, errmsg=<message>