SunDiag User's Guide: Addendum for SMCC Hardware
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SBus Test Descriptions

3

These chapters describe the tests that are designed to test specific SMCC SBus products. These tests will be displayed under the SBUS Devices section of the SunDiag control panel:
SBUS DEVICES
lpvitest (SBus Printer Card Test)page 3-2
bpptest (SBus Printer Card Test)page 3-5
xbtest (SBus Expansion Subsystem Test)page 3-8
sunlink (HSI/S Boards Test)page 3-14
pstest (Prestoserve NFS Accelerator Test)page 3-18
spiftest (SBus Serial Parallel Interface Test)page 3-20
leotest (ZX Graphics Accelerator Test)page 3-30
spdtest (NeWSprinter Test)page 3-45
rtvctest (SunVideo Test)page 3-48
pcmciatest (PCMCIA Modem Card Test)page 3-57
irtest (Infrared Interface Test)page 3-59
plntest (SPARCstorage Array Controller Test)page 3-61

3.1 SBus Printer Card Tests (lpvitest and bpptest)

SBus printer cards have two printer ports: one for SPARCprinters(TM), and one for any parallel port printer. lpvitest verifies the functionality of SPARCprinters, and bpptest verifies the functionality of bi-directional parallel port printers.

3.1.1 Printer Test Hardware and Software Requirements

The SBus Printer Card and device drivers must be installed in order to run lpvitest or bpptest. The printer to be tested must be connected to the SPARCprinter or bi-directional parallel port, and powered-up. If both a SPARCprinter and a parallel port printer are hooked up to the SBus card, you can test both simultaneously.

Note - In a SPARCstation 10(TM), SPARCstation LX(TM), or SPARCclassic(TM) system, you can connect a printer directly to the onboard parallel port to run bpptest.

If you are testing the SPARCprinter port, be sure the magnets on the SPARCprinter paper tray are set to the correct paper size. For more information, see the SPARCprinter Installation and User's Guide.
If you run lpvitest and bpptest in conjunction with the vmem test, you need at least 10 megabytes of available swap space. If you have less than 10 megabytes of swap space available, add 5 more, regardless of the number of SBus cards installed.

3.1.2 lpvitest Test Description

This test verifies that your SBus card and SPARCprinter are working properly by attempting to transfer a data pattern from the SBus card to the SPARCprinter and printing the pattern.
There are two indications if the card and printer are functioning properly. First, you will be able to see from the SunDiag Status Window that lpvitest has made a successful pass, and second, the pattern transmitted to the printer has printed correctly.
If this test passes successfully, you know that the SBus DMA circuitry, the SPARCprinter, and the device driver are functioning properly.

Grafik

Figure 3-1 lpvitest

3.1.3 lpvitest Options

Access Direction of data transfer; this field is informational only. Writeonly is the only option currently available. This indicates that the only data being transferred is going from the SBus printer card to the SPARCprinter. There is no return signal.
Mode Print image intervals. This option allows you to select how often to print the test image. The default setting is Fast; the choices are:
FastPrints an image every 10 seconds.
MediumPrints an image every 12 minutes.
ExtendedPrints an image every 30 minutes.
Image Which image to print. This option allows you to choose which test image to print. The choices are:
DefaultA pattern of vertical lines on one page and a checkerboard pattern on another.
57fontsAn image of the 57 different fonts that the printer supports.
Userdefined You can use any rasterfile as a test image. Just place the file in
the /opt/SUNWdiag/bin directory and save it as the filename u_image.
Resolution This setting defines the printer resolution of the printed test pattern. The choices are 300 or 400 dots per inch.

Note - Patterns such as the default test pattern will be printed at different sizes at different dpi resolutions. The text in the 57fonts pattern will print in the same size, using the two different resolutions.

3.1.4 lpvitest Command Line Syntax

/opt/SUNWdiag/bin/lpvitest D=device_name W I=image R=resolution M=mode
standard_arguments

Arguments
D=device_namedevice_name is the name of the device. This should be of the form
/dev/lpvi#, where # is the number of the device.
WSpecifies write-only. This flag is mandatory.
I=imageThis is the name of the file containing the test image. Possible values are:

imagefile Any file containing user-defined images. Before running SunDiag, copy the raster image file to the /opt/SUNWdiag/bin directory and save it with the filename u_image. The size of the image is adjusted based on the resolution.

Arguments (Continued)

57fonts Contains an image of 57 fonts. The size of the image is adjusted based on the resolution.

default The default images print on two pages, one image is a pattern of vertical lines and the other is a checkerboard.

R=resolutionresolution is the resolution of the output in dots per inch (DPI). Possible values are 300 and 400.
M=modemode is the print speed mode. This is the rate at which the test image is printed. Possible values are:

fast..Prints the test image at 10-second intervals.

medium Prints the test image at 12-minute intervals.

extended Prints the test image at 30-minute intervals.


Extra Swap Space Required: 1 MB Per Board

3.1.5 lpvitest Quick Test Description

Running this test in quick mode causes testing to stop after a single data transfer.

3.1.6 bpptest Test Description

This test verifies that your SBus card and parallel port printer are working properly by attempting to transfer a data pattern from the SBus card to the printer and printing the pattern.
There are two indications if the card and printer are functioning properly. First, you will be able to see from the SunDiag Status Window that bpptest has made a successful pass, and second, the pattern transmitted to the printer has printed correctly.
If this test passes successfully, you know that the SBus DMA circuitry, the printer, and the device driver are functioning properly.

Note - Large Postscript files or raster files may require the printer to have 2 Mbytes or more memory. Otherwise, half of the print may appear on one sheet and half on another sheet.

Grafik

Figure 3-2 bpptest

3.1.7 bpptest Options

Access Direction of data transfer; this field is informational only. Writeonly is the only option currently available. This indicates that the only data being transferred is going from the SBus printer card to the SPARCprinter. There is no return signal.
Mode Print intervals. This option allows you to select how often to print the test image. The default setting is Fast; The choices are
FastPrints an image every 10 seconds.
MediumPrints an image every 12 minutes.
ExtendedPrints an image every 30 minutes.

3.1.8 bpptest Command Line Syntax

/opt/SUNWdiag/bin/bpptest D=device_name W M=mode

Arguments
D=device_namedevice_name is the name of the device. This should be of the form
/dev/bpp#, where # is the minor number of the device.
WStands for write-only. This flag is mandatory.
M=modeThe test image is a continuous printout of the ASCII character set. mode is the print rate of the test image. The image itself is a continuous printout of the ASCII character set. Possible rates are:

fast....Prints the test image at 10-second intervals.

medium...Prints the test image at 12-minute intervals.

extended Prints the test image at 30-minute intervals.

3.1.9 bpptest Quick Test Description

Running bpptest in quick mode causes testing to stop after a single data transfer.

3.1.10 Error Messages

If the SPARCprinter prints a blank page, verify that the magnet settings on the paper tray are set to the correct paper size. For more information, see the SPARCprinter Installation and User's Guide.
If you see a message like this:
lpvi0 lpvitest ERROR: Device busy 16

you may need to halt currently running print jobs.

3.2 SBus Expansion Subsystem (xbtest)

This test verifies the functionality of the Sun SBus Expansion Subsystem hardware and its peripherals.

3.2.1 xbtest Test Description

xbtest has two mutually exclusive test modes: transparent and nontransparent. Transparent mode tests SBus Expansion Subsystem peripherals, such as SBus cards and disk drives. You should not select transparent mode if the SBus Expansion slots are empty.

Note - Nontransparent mode will test the Expansion Subsystem itself. You should not select nontransparent mode if there are any SBus cards installed in the SBus Expansion slots.

3.2.1.1 Transparent Mode

After you invoke xbtest, the system will fork into two processes. The first, the parent process, will wait for the exit of the child process and then exit. The child process will issue an WAIT_FOR_ERROR_PAK ioctl call and then enter a sleep mode.
When the device driver receives an error, it wakes up and passes an error packet to the child process. The child process dumps the contents of the error packet, and also exits.
If the system does not receive an error message before the end of the test time period, the trap handler routine calls clear_for_wait_error. The procedure will then exit to the parent process. The system will then exit back to the SunDiag system control.

3.2.1.2 Nontransparent Mode

If you do not have an SBus Expansion Subsystem SBus card in any slot of your system, you must add the following line to the /etc/system file:

  set xbox:xbox_no_cards_in_slot0=1  

After adding this line to /etc/system, reboot the machine using the -r option. You will now be able to run the Nontransparent mode of xbtest.
This mode tests the Expansion Subsystem hardware; the subtests are described below. The systems will repeat each of these tests ten times. Time-out checks are included to avoid indefinite hangs. Failure of any test should not result in a system panic, although full recovery is not guaranteed.
Self Diagnostic Test 1. Do a hard reset.
  1. Check for expected value from XAC register.

  2. Do a DVMA XAC Interrupt Test

    a. Cause a DVMA transfer by asserting DVTE + INTT in control register 1 of XAC.

    b. Wait for interrupt.

    c. Compare error status packet with expected values.

  3. Do a DVMA XBC Interrupt Test

    a. Cause a DVMA transfer by asserting DVTE + INTT in control register 1 of XBC.

    b. Wait for interrupt.

    c. Compare error status packet with expected values.

Grafik

Figure 3-3 xbtest

3.2.2 xbtest Configurations

The top section of the xbtest Options menu displays the Sbus card being tested.

3.2.3 xbtest Options

XBtest Mode Change the test mode by clicking SELECT on one of the two exclusive setting boxes. See Section 3.2.1.2, "Nontransparent Mode" before attempting to run Non transparent mode.
XBtest Time This option specifies how long this xbtest waits for an error to be returned. You can change the XBtest Time setting by selecting the text field and typing the number of minutes you want the test to run.

3.2.4 xbtest Command Line Syntax

When running the xbtest from the command line, you must specify the physical pathname of the subsystem unit to be tested. For example, to run xbtest on a SPARCstation(TM) 10 (Sun-4m) system, you would type:

 # /opt/SUNWdiag/bin/xbtest D=/devices/iommu@f,e0000000/sbus@f,e0001000/SUNW,xbox@1,0:diag M=t  

/opt/SUNWdiag/bin/xbtest D=device_name WE T=test_time SD M=mode
standard_arguments

Arguments
D=device_namedevice_name specifies the physical path name of the subsystem unit to be tested. You need to search the /devices tree to find the physical pathname of the subsystem. Note: You must include the device_name path when running xbtest from the command line.
WEWait for Error. This option directs xbtest to run in transparent mode. This option will run xbtest continually until an error is returned, or until the time interval specified with the T=test_time option has ended.
T=test_timeUsed only with the WE option. test_time specifies how long this test will wait for an error to be returned. Substitute test_time with the number of minutes you want xbtest to wait. The default is 6 minutes.
SDSelf Diagnostic test. This options directs xbtest to run in nontransparent mode. See Section 3.2.1.2, "Nontransparent Mode," on page 3-8, before attempting to run nontransparent mode.
M=modemode can be one of the following:
t to run xbtest in transparent mode
nt to run xbtest in nontransparent mode

3.2.5 xbtest Quick Test Description

In quick test mode, xbtest executes the transparent wait-for-error test, using the default wait time of 6 minutes. If you select the nontransparent self-diagnostic test option, xbtest executes the option only once. In normal mode, xbtest executes the nontransparent self-diagnostic test three times.

3.2.6 xbtest .usertest File Example

The following are samples of .usertest commands:

  xbox0 transparent mode, xbtest, S D=(physical path name for xbox0) WE T=1  
  xbox0 nontransparent mode, xbtest, S D=(physical path name for xbox0) SD  

3.2.7 xbtest Error Messages

Whenever errors are returned by the system, SunDiag will display the following error message in the SunDiag console window:

  error status dirty bit n  

The system will return a hexadecimal number n to indicate the error incurred. The list of errors is in Table 3-1.

Note - The SBus Expansion Subsystem is a Field Replaceable Unit and should only be serviced by Sun service personnel. If you see one of these error messages, call your local Sun service representative.

Table 3-1
Error MessageMnemonicBit Number
expansion sbus read error (err ack)xreac
expansion sbus read error (rsvd ack)xrrab
expansion sbus read error (late)xrlea
expansion sbus timeout errorxbto9
write 0 errorwrxr8
buffer write error (err ack)bwea7
buffer write error (rsvd ack)bwra6
buffer write error (late error)bwle5
cable resend timeout error (dpr0)crtl4
cable ack timeout errorcato3
Table 3-1 (Continued)
Error MessageMnemonicBit Number
cable parity errorcadp2
cable serial interrupt parity errorcsip1
child not ready errorcnrd0
The system may return one or more of the following error messages, where %d is the number of times the test failed:
Table 3-2 xbtest
probe xbox device failed
action_on_error ioctl command fail
xbox status ioctl command fail
can not switch to non transparent mode
self diag test failed in TEST_NON_TRANSPARENT count %d
self diag test failed in TEST_XAC_DVMA.int count %d
self diag test failed in TEST_XBC_DVMA.int count %d
XAC_TRANSPARANT ioctl command fail
XAC_NON_TRANSPARANT ioctl command fail
(device name): main:fork (device name)
XAC_WAIT_FOR_ERROR ioctl command fail
XAC_CLEAR_WAIT_FOR_ERROR ioctl command fail

3.3 HSI/S Boards Test (sunlink)

This test verifies the functionality of the SBus HSI boards. sunlink tests the HDCL and SDLC protocol of SBus HSI boards.

3.3.1 sunlink Test Description

sunlink downloads the DCP microcode, initializes the selected channel, and configures the selected channel to the protocol being tested.
Next, sunlink opens a datagram socket and tries to modify the socket to accept ioctl communications with the driver, and receive sync mode information from it.
sunlink then opens the ports, linking the upper and lower layers with ioctl calls. After initialization, this test checks for activity before attempting to send or receive data. An error message is returned if activity is detected; otherwise the transmit buffer is filled with random data. Random data is used by default; other patterns may be specified. The data is then transmitted. If the transmission succeeds, sunlink then receives the returned data and verifies that it is identical to what was sent.
Finally, statistics about the send and receive are gathered from the socket.
A full sunlink test takes approximately 8 mins/port. sunlink does a brief check of the board ports before the actual test begins. If the port is bad, the test immediately aborts and returns an error message.

Note - This test will not pass unless you install the correct loopback connectors or port to port cables on the ports you are testing. The ports specified for test in the option menu must have loopback connectors attached. See Appendix A for loopback connector part numbers and wiring instructions.

3.3.2 sunlink Configurations

The Configurations field displays the available ports.

3.3.3 sunlink Options

Grafik

Figure 3-4 sunlink

Clock Source Clock Source gives you the choice of using either the on-board or external clock for use within sunlink. In order to use the external clock option, the transmit, receive, and clock data lines must be physically loopbacked.
Internal Loopback Click SELECT to enable or disable internal loopback tests. Internal Loopback is only needed when the Loopback setting is not port-to-port, and the clock source is on-board.
Loopback The Loopback cycle option specifies the loopback type. The choices are: simple single external port loopback, multiple external port loopback, and port-to-port external loopback.

3.3.4 sunlink Command Line Syntax

/opt/SUNWdiag/bin/sunlink [device_name clock_source port#] pdata_pattern iloopback_type I k st standard_arguments
Arguments
device_nameSpecifies the device to be tested.
hih HDLC and SDLC protocols
clock_sourceo..On Board
e..External
port#The port number to be tested. For example, hiho0. 0 is the port number.
pdata_patterndata_pattern is one of the following:
c..Specifies character (0x55)
i..Incrementing
d..Decrementing
r..Random.
IEnables internal loopback for HSI/S.
kLoad DCP kernel
stDisplay sunlink status only
The following is a typical command line syntax for testing an HSI/S Sbus card:

  woodberry% /opt/SUNWdiag/bin/sunlink hiho0 I  

Typing this at the command line will test port 0's internal loopback.

3.3.5 sunlink Quick Test Description

Running this test in quick mode abbreviates the test procedure. Normally, the internal and external loop counts are set to 100. The internal loop count is set to 1 for the quick test; the external loop count remains at 100. Normally, this test receives time-out checks every 600 seconds; in the quick test, it receives the checks every 4 seconds.

3.3.6 sunlink Loopback Connectors

When selecting the SCP2 loopback assignments, the "To" port number is connected to the "From" port shown directly above it. For example, in the option menu shown above, ports 0 and 1 are looped, and ports 2 and 3 are looped. If port 3 were not specified, ports 0 and 1 would be linked and port 2 would be looped to itself:
From: 0, 2
  To: 1

Refer to Appendix A of this manual, and the High Speed Serial Interface hardware manuals for information on loopback connectors.

3.4 Prestoserve Test (pstest)

3.4.1 pstest Test Description

Prestoserve is an NFS accelerator. It reduces the frequency of disk I/O access by caching the written data blocks in non-volatile memory. Prestoserve then flushes the cached data to disk asynchronously, as necessary. pstest verifies Prestoserve's functionality with the following three checks:
Board Battery Check To ensure proper battery power level, the test runs this check before running the other two checks. If it finds a bad battery, it exits pstest immediately with a "fatal error" message.
Board Memory Check This check maps the entire board memory to a process address space and locks the board to prevent multiple accesses. The test then travels through the mapped address spaces sequentially, doing a "char," "short," and "long" comparison on each. pstest executes this check twice.
Board Performance and File I/O Access Check This check exercises only synchronous read/write access. pstest writes data equal to the amount of on-board memory to the memory cache and reads the data back for comparison. The time taken to write that data is measured twice: the first time with Prestoserve disabled, the second time with Prestoserve enabled. The first value is divided by the second to get the performance ratio. If the ration is less than 1.5 on three passes of the test, the Prestoserve board may or may not have a problem.
Since Prestoserve accelerates the /opt partition during testing and this partition may be mounted remotely, there may or not be a problem with the Prestoserve board itself; rather, a network performance problem could be the root of the problem. In either case, a warning message is displayed if the performance ratio is less than 1.5.

CAUTION Caution - To insure that consistent results are obtained, run as many concurrent tests as possible when a Prestoserve product has been installed. Tests are selected from the Option menu. The default is 2; the maximum is 10. However, do not enable pstest and kmem at the same time. Running these tests together causes SunDiag to incorrectly report errors.

3.4.2 pstest Command Line Syntax

 /opt/SUNWdiag/bin/pstest l e standard_arguments

Arguments
lEnable long memory test.
eEnable performance warning, which will display a warning message if the performance ratio is less than 1.5.

3.4.3 pstest Quick Test Description

Running pstest in quick mode changes the test algorithm as follows:
  • Board Battery Check - No difference
  • Board Memory Check - The check will be executed once instead of twice.
  • Board Performance and File I/O Access Check - No difference

3.5 Serial Parallel Controller Test (spiftest)

SunDiag uses the Serial Parallel Controller device driver to access the card components such as the cd-180 and ppc2 chips, and the serial and parallel ports.

3.5.1 spiftest Hardware Requirements

Before running SunDiag system exerciser, make sure you install the cards to be tested and the device driver. Also, you should reboot your system with the boot -r command to reconfigure the system and allow the SunDiag kernel to recognize the new driver.
The following minimum hardware configuration is required to successfully run the Internal Test:
  • SBus-based SPARC desktop system with an SBus slot.
  • Serial Parallel Controller card, installed in one of the SBus slots.
The following hardware is also required to successfully run the other Sundiag Serial Parallel Controller tests:
  • Serial Parallel Controller Patch panel (Part No. 540-2007).
  • 96-pin loopback plugs (Part No. 370-1366).
  • 25-pin serial loopback plugs (Part No. 540-1558).
  • RS-232 serial cables (Part No. 530-1685).
  • TTY terminal.

Note - spiftest must be run in intervention mode.

Grafik

Figure 3-5 spiftest

3.5.2 spiftest Configurations

The Configurations: section displays the serial ports available for the SPC/S board. The available ports are as follows:
Board NumberBoard DeviceSerial PortsParallel Ports
0stc0term/0-7printers/0
1stc1term/8-15printers/1
2stc2term/16-23printers/2
3stc3term/24-31printers/3
4stc4term/32-39printers/4
5stc5term/40-47printers/5
6stc6term/48-55printers/6
7stc7term/56-63printers/7

3.5.3 spiftest Options

96-pin Loopback (LB) This test provides data transmission, full-modem loopback, and parallel port loopback testing. You must attach a 96-pin loopback plug to the card under test before running this test (See Appendix A).
Internal Test This test performs a quick internal check of the Serial Parallel Controller card(s) installed in SBus slots. You do not need to attach anything to the card(s) to perform this test.
25-pin Loopback (LB) This test provides full-duplex transmission and full-modem loopback testing of the serial port selected in the Serial Port section of this menu. You must attach a 25-pin Loopback plug to the serial port on the patch panel that is being tested (See Appendix A). This test cannot be run concurrently with the Echo-TTY option enabled.
Parallel Printer This test sends the entire ASCII character set to a parallel printer. You must attach a parallel printer to the parallel port on the Serial Parallel Controller patch panel. Observe the printer output to validate the test.
Echo-TTY This test checks the proper operation of the serial port selected in the Serial Port section of this menu by echoing characters typed on a TTY terminal keyboard to the TTY terminal screen. Type anything on your TTY keyboard, and the characters you type should show up on the TTY screen. If you do not type anything, this test will eventually time-out. This test is terminated by pressing Control-C. After a short delay, the Status Window updates the Pass Count. This test cannot be run concurrently with the 25-pin Loopback subtest.
Char Size Character length; choose 5, 6, 7, or 8 characters.
Stop Bit Specifies the number of stop bits; choose 1 or 2 bits.
Baud Rate Specifies the baud rate; choose 110, 300, 600, 1200, 2400, 4800, 9600, 19200, or 38400 baud.

Note - The baud rate of 38400 can only be used if one port is tested at a time and the Internal Test is disabled.

Parity Specifies the selectable parity; choose none, odd or even.
Flow Control Specifies the selectable flow control; can be XOnOff, rtscts, or both.
Data Type Specifies the selectable data type pattern; can be 0x55555555, 0xaaaaaaaa, or random. 0x55555555 and 0xaaaaaaaa are abbreviated "0x55" and "0xaa" on the option menu.
Serial Port Specifies the serial port to be tested. The available ports are listed in the Configurations section at the top of the spiftest options menu.
You can also change the test options by modifying the /opt/SUNWdiag/bin/.usertest file. See Section 1.8, "Adding Your Own Tests in .usertest" in Chapter 1 of the SunDiag User's Guide.

3.5.4 spiftest Command Line Syntax

/opt/SUNWdiag/bin/spiftest D=device_name T=subtest_number B=baud_rate C=character_length S=#of_stop_bits P=parity F=flow_control I=loopback_pattern standard_arguments
Arguments
D=device_namedevice_name is the device to be tested. There is no default; you must type a device name. It can be either a board (sb1-8) or an individual port (term/0 - term/63):

sb1......The 8 serial ports in the first card

sb2......The 8 serial ports in the second card

sb3......The 8 serial ports in the third card

sb4......The 8 serial ports in the fourth card

sb5......The 8 serial ports in the fifth card

sb6......The 8 serial ports in the sixth card

sb7......The 8 serial ports in the seventh card

sb8......The 8 serial ports in the eighth card

or

/dev/term/mm

Where mm is 0 - 63 (any of the serial ports in SBus card slots)

Arguments
T=subtest_numbersubtest_number is one of the subtest options below. These are binary representations of the test values. You can enter one value, or the sum of any combination. There is no default; you must type a value:

1.......Internal loopback test

2.......Printer test Note: Requires parallel printer if run alone.

4.......96-pin loopback test

8.......DB-25 loopback test

16.......Echo-TTY test

Here are two examples of subtest combinations:

10.......Printer test with the DB-25 loopback test

18.......Printer test with the Echo-TTY test

B=baud_ratebaud_rate is one of 110, 300, 600, 1200, 2400, 4800, 9600, 19200, or 38400. The default is 9600. To use the 38400 rate, only one port at a time can be tested, and the Internal Test must be disabled.
C=character_lengthcharacter_length specifies a character length between 5 and 8.
The default is 8 characters.
S=#of_stop_bits#of_stop_bits is the number of stop bits. The default is 1.

1.......1 stop bit

2.......for two stop bits

P=parityParity. The default is none; the options are:
none
odd
even
F=flow_controlFlow Control Protocol. The default is rtscts.

xonoff....Xon/Xoff

rtscts....hardware flow control

both.....xonoff and rtscts

Arguments

I=loopback_patternloopback_pattern is the loopback test data pattern. The default is a.

5an 0x55555555 pattern

aan 0xaaaaaaaa pattern

ra random pattern

3.5.5 spiftest Quick Test Option

Running this test in quick mode restricts testing to the Internal Loopback Test. The internal loopback test performs a quick internal check of the Serial Parallel Controller card(s) installed in SBus slots. You do not need to attach anything to the card(s) to perform the quick test.

3.5.6 spiftest Error Messages

These error messages are generated when the Sundiag Serial Parallel Controller discovers fatal errors. The error descriptions below identify possible causes for the card or test failure, and identify the Field Replaceable Unit (FRU), if possible. The three FRUs affected are: the Serial Parallel Controller card, the 96-pin shielded cable, and the Patch panel.
This section also provides suggestions if an error is not hardware related.
No SPC/S card found or device driver not installed
  An incorrect slot number was specified, or a non-SPC/S card was found, or
  the device driver was not installed.

Ioctl STC_DCONTROL(STC_REGIOW-COR2) error on <device name>, or

Ioctl STC_DCONTROL(STC_REGIOR-CCR) error on <device name>, or
Ioctl STC_DCONTROL(STC_REGIOW-CCR) error on <device name>, or
Ioctl STC_DCONTROL(STC_PPCREGW-PDATA) error on <device name>, or
Ioctl STC_DCONTROL(STC_PPCREGR-PDATA) error on <device name>, or
Ioctl TCSETS failed on <device name>, or

Ioctl TIOCMGET error on <device name>, or

Ioctl TIOCMSET error on <device name>, or

Ioctl STC_GPPC error on device <device name>, or

Ioctl STC_SDEFAULTS error on <device name>, or

Ioctl STC_DCONTROL error on <device name>
  The device driver was not installed correctly, or the card is not working (see
  system console for messages). You may need to reinstall the device driver.

Expected DSR set, observed clear
Parallel port loopback test failed on <device name>
  The modem lines DSR are not stable, or the parallel port is not sending the
  correct data, or the 96-pin loopback plug either is wired incorrectly or not
  making proper contact.

Expected <pattern>
Observed <pattern>
Modem loopback test failed on <device name>
  The modem lines are not stable. If the modem loopback test passed on the
  96-pin loopback test and failed on the 25-pin loopback test, then it is
  possible that either the patch panel or the cable is not functional. Also, make
  sure the loopback plug is making proper contact.

Can't enable SP-96 when DB-25, Print or echo-tty test
option is selected!
  The 96-pin loopback test was selected while an incompatible option (25-pin
  Loopback, Parallel Print, or Echo-TTY) was also chosen.

Can't enable echo-tty when DB-25 or SP-96 test option is
selected!

Echo-TTY test was selected while an incompatible option (25-pin or 96-pin loopback tests) was also chosen.
Can't enable Parallel Print when SP-96 test option is
selected
  The Parallel Print test was enabled while an incompatible option (25-pin
  Loopback test) was also chosen.

Can't open <device name> with file descriptor <number>

This is an internal error. Contact Sun for technical assistance.
Device <device name> already open
  Two tests are trying to access the same device at the same time or the device
  is already busy running another process.

Open error on <device name>, device driver may not be
installed properly

The device driver is not installed, or not installed properly. When the SPC/S board is removed from a system, the device driver is unloaded at the next boot. If the board is reinstalled, the device driver must then be reloaded with the /usr/sys/unbundled/stc_config installation script. Otherwise, Sundiag will not recognize the board, or display spiftest as an option, and will return this error message.
Read error on <device name>, or

Write error on <device name>

Another application is currently using this device or there is a board error.
Paper out error on device <device name>,
  The parallel printer may be out of paper, or there is no printer connected.
  Check the printer status.

Off-line error on device <device name>, or
Busy error on device <device name>, or
Error on device <device name>

The parallel printer may be off-line, busy printing data, or some other error condition exists. Check the printer status.
Expected <number> bytes, observed <number> bytes
Internal test failed on <device name>
  Data transmission failed because you're running the internal loopback with
  another test in .usertest mode, or there is a hardware error. The Serial
  Parallel Controller card must be replaced.

Expected = <pattern>, observed = <pattern>
Internal test failed on <device name>
  Data transmission failed, the card must be replaced.

Expected = <pattern>, observed = <pattern>
Data loopback failed on <device name>

Data transmission failed because you are running the internal loopback with another test, or the loopback connector is not making proper contact, or the card failed. Re-insert the connector and make sure it makes proper contact. If the test still fails and if you are running the 25-pin loopback test, you can try to run the 96-pin loopback test to isolate the problem. If both tests fail for the same port, then it is possible that the card is not functional. If the 96-pin test passes, and the 25-pin doesn't, try the test with a different cable, loopback plug, or patch panel.
Timeout error on <device name>
  The system is heavily loaded or has a large amount of swap space
  configured. Try running spiftest alone.

No loopback plug found on <device name>

Timeout error, or
tty terminal is not connected to <device name>

No terminal is connected, or the Echo-TTY test has not been terminated with a Control-C.

3.6 ZX Graphics Accelerator Test (leotest)

SunDiag verifies the Sun Microsystems ZX Graphics Accelerator with a sequence of subtests. All tests are nondestructive and maintain the system integrity during and after the tests are run.

CAUTION Caution - Do not run any other application that uses the ZX accelerator port while running leotest. This combination will cause SunDiag to return incorrect errors.


Note - leotest requires approximately 2.0 Mbytes of disk space in the /tmp directory to extract its working files. If this space is not available, the diagnostic will fail and report warning and error messages indicating lack of disk space.

By default, SunDiag runs all of the available tests, except the Stereo test. See the Test Descriptions section below.

Note - To avoid excessive test cycle times when testing the ZX Graphics Accelerator, follow these instructions:
  1. Enable Single Pass on the SunDiag Options menu. 2. Enable Verbose on the SunDiag Options menu. 3. Do not select any other diagnostic tests.

Following these procedures will ensure that leotest will run once, report status as each test routine executes, and then exit.

Note - Disable all screen savers before testing any graphics device. Type xset s off at a UNIX prompt to disable the Solaris screen saver.

Grafik

Figure 3-6 leotest

3.6.1 leotest Test Description

leotest is divided into two subtest categories: Direct Port Tests, and Accelerator Port Tests.

3.6.1.1 Direct Port Tests

The direct ports tests check the non-accelerated portion of the ZX using the following subtests.
Video Memory The video memory array subtest selects and tests 64 by 64 pixel regions covering all video memory planes, including the 24-bit double-buffered image plane, 8-bit overlay plane, 24-bit depth (Z buffer) plane, and10-bit WID plane. If the subtest detects an error, SunDiag reports the defective plane and location.
LUTs This subtest performs a non-destructive read-write test on the frame buffer color look up tables and the window ID look up tables. After the test is done, the previous contents of these tables will be restored. If this subtest detects a failure, SunDiag reports the location of the failure.
At the beginning of this subtest, red, green, and blue stripes display for visual verification of the digital-to-analog converters (DACs).
Frame Buffer Output The Frame Buffer Output subtest creates various windows in the Window ID plane then sets up the look up tables (LUTs) associated with these windows. This subtest then writes random values to the video memory of these windows. Next, the test verifies the image RGB data of each pixel by triggering the trap registers, reading and generating RGB checksums from these values, and comparing these checksums with known values. This is also a visual cursor test as the cursor is being displayed for each pixel that is under test.

CAUTION Caution - Moving the mouse cursor during the test will prolong the test, and may cause failures. For best results, remove the mouse from the mouse pad during this test.

3.6.1.2 Accelerator Port Tests

The accelerator port test consists of a sequence of subtests which are designed to ensure the ZX Graphics Accelerator integrity at the system level. They take as their inputs accelerator port transaction files. These files contain graphic data which are passed to the ZX Accelerator port in groups of 32-bit words called "packets." These packets contain dots, vectors, triangles, and pass-through commands, and are generated in either immediate (programmed I/O) or DMA mode. The ZX SunDiag queries the system software for DMA capability, and if applicable, will render objects in DMA mode for some subtests. For more information on ZX hardware, please refer to the Leo Hardware Reference Manual.
For verification, after the image is rendered to the frame buffer, each subtest reads the RGB image data from the frame buffer and compares the data against known good images. To save disk space, the good image data are stored in a reduced size (64 times smaller that the normal size), and are stored in the Sun raster file format. The files are stored in the leotest.data file in /opt/SUNWdiag/bin.

Note - These subtests verify a frame buffer region of 1152 by 900 pixels, regardless of the size of the monitor attached to the system.

Microcode SRAM Checksum and Read/Write Selftest This subtest sends a diagnostic package to the microcode of the Floating Point Transform engine to instruct it to reset the accelerator port, run the SRAM selftest, and restart the engine. Then it will verify each SRAM of all four Leo Float chips in the Floating Point Transform engine to make sure they have the same checksum. If not, it will report error using the information passing to it from the microcode. It also performs non-destructive read/write tests on each SRAM.
Primitive This subtest renders primitives such as dots and lines as well as triangles with different color and shading at each vertex.
Vector This subtest renders fairly large vector objects with aliased and anti-aliased vectors. This subtest will be rendered in DMA mode, when applicable.
Viewport Clipping This subtest renders and clips an object around and in front on the screen.
Hidden Surface This subtest renders objects with the Z-buffer-compare attribute turned on.
Polygon Edge Highlighting This subtest renders an object with the polygon edge attribute turned on. This subtest will be rendered in DMA mode, when applicable.
Transparency This subtest renders a scene with two transparency modes (stand-alone and alpha blend) in various degrees. This results in a two-pass transparency of the objects in the scene. This subtest will be rendered in DMA mode, when applicable.
Depth-Cueing This subtest renders an object with the depth-cueing attribute turned on.
Lighting and Shading This subtest renders an object with multiple light sources and Gouraud shading for front and back surfaces. This subtest will be rendered in DMA mode, when applicable.
Raster Copy This subtest renders 32-bit image and various subregions of it, and zoom in on a subregion, using the microcode raster data copy command.
Picking This subtest has two parts: a pick detect test and a pick echo test.
XGL The transaction file for this subtest was generated from an XGL program to ensure that the XGL registers are exercised.
Arbitration This subtest continually renders an object into the accelerator port while a second process performs a read-write test to the WID planes from the direct port on the Frame Buffer. This subtest simulates conditions in the real world, where rendering processes and windows operation run concurrently. This subtest will be rendered in DMA mode, when applicable.
Stereo (Interactive) This subtest displays text information in stereo mode. The user verifies proper operation by looking at the screen with stereo glasses and following the instructions being displayed.

3.6.1.3 ZX SunDiag Options

Loops per subtest Type the number of times each test should be run before going on to the next test. The default is 1 loop.
Loops per test sequence Type the number of times the entire test sequence should be run. Each sequence pass will register one in the SunDiag Pass Count window. The default is 1 loop.
FB Locking See the "Special Note on Testing Multiple Framebuffers" section in Chapter 1 of the SunDiag 4.4 User's Guide for details.
Pattern Press MENU to select a data pattern for use in the direct port tests. The default is "r" for random patterns. You may select a pattern of 0s, 3s, 5s, or 9s. For example, if you choose a pattern of 3s, the value 0x33333333 will be written to and read from the frame buffer.

3.6.2 leotest Command Line Syntax

/opt/SUNWdiag/bin/leotest  D=device_name S=subtest_number
F=#_of_subtest_loops B=#_of_test_loopsL  standard_arguments

Arguments
D=devicenamedevice_name is the full path name of the device under test. The default is /dev/fbs/leo0.
S=subtest_numbersubtest_number is the test number of the subtest to be run. Select from the subtests below. You can run multiple subtests by adding the subtest numbers. For example, n=0x3 runs both test 1 and test 2; n=0x180 runs both test 0x080 and test 0x0100. Note that you do not need the leading zeros. To run all tests, enter n=0xFFFF. 0x 000 001 Direct port--video memory 0x 000 002 Direct port--CLUTs and WID LUTs 0x 000 004 Direct port--Frame buffer output section 0x 000 008 Direct port--SRAM checksum & Read/Write

0x 000 010 Accelerator port --primitives 0x 000 020 Accelerator port--vectors 0x 000 040 Accelerator port--clipping 0x 000 080 Accelerator port--z-buffer 0x 000 100 Accelerator port--polygon edge 0x 000 200 Accelerator port--transparency 0x 000 400 Accelerator port--depth cueing 0x 000 800 Accelerator port--lighting & shading 0x 001 000 Accelerator port--raster copy 0x 002 000 Accelerator port--picking 0x 004 000 Accelerator port--XGL 0x 008 000 Accelerator port--arbitration 0x 010 000 Accelerator port--stereo (interactive)

F=#_of_subtest_loops#_of_subtest_loops is the number of loops for each subtest. The default is 1 (one loop)
Arguments(Continued)
B=#_of_test_loops#_of_test_loops is the number of loops of each test sequence. The default is 1 (one loop).
LDisables framebuffer locking. See the "Special Note on Testing Multiple Framebuffers" in Chapter 1 of the SunDiag 4.4 User's Guide for details.
P=pattern_numberSelect a pattern number for use with the direct ports tests. The default is r, for random patterns. You may also choose 0, 3, 5, or 9.

3.6.3 leotest Quick Test Description

Running this test in quick mode does not change the test procedure.

3.6.4 leotest Command Line Examples

Here are three examples illustrating how to run leotest from a command line. Make sure to change the directory to /opt/SUNWdiag/bin before running leotest from the command line. leotest is hard-wired to look for its data file, leotest.data, in /opt/SUNWdiag/bin.
  1. A Simple accelerator port test, "primitive" single pass:


  machine# cd /opt/SUNWdiag/bin  
  machine# leotest S=0x10  

  1. All direct port tests, five loops of sequence:


  machine# cd /opt/SUNWdiag/bin  
  machine# leotest S=0x7 B=0x5  

  1. All subtests (except the interactive tests), two loops of each subtest, four loops of each test sequence:


  machine# cd /opt/SUNWdiag/bin  
  machine# leotest S=0xFFFF F=2 B=4  

3.6.5 leotest Error Messages

The ZX SunDiag error messages are described below. The error messages are listed in alphabetical order.
Arbitration test failed.
  The arbitration test fails, and the cause is given in the following message.

Background process wouldn't die. System error.

A software error. You may have to re-boot the SPARCstation.
Busy wait exceeded %d loops. Error in the Floating Point
Transform section. Re-run Leoconfig.

A timeout error condition. Possibly there is a problem with the Floating Point Transform section, and the leoconfig software (located in /etc/opt/SUNWleo/bin/leoconfig) should be executed again. Check the man pages on leoconfig for more details.
[Plane group name] Byte Access Mode error at x=%d y=%d,
bank=#, expected=0x#x, observed=0x#n, XOR=0x#x.

The direct port video memory test has found an error at pixel (x,y) in the named plane group. The bank # refers to the corresponding VRAM bank number. Byte/Stencil Access Mode applies to all plane groups that access 8 bits of the frame buffer memory (in other words, the 8-bit image and overlay planes). The test expected to find exp but observed obs, yielding xor when the two values are exclusive or'd with each other.

Note - The following error messages are software errors. They are grouped together because the cause of the errors is similar. The reason for the errors is described at the end of the list.

Cannot read Window ID look up table from device [device].
Check device for existence and/or permissions.

Cannot write Window ID look up table to device [device].
Check device for existence and/or permissions.

Cannot read Color LUTs from device [device]. Check device
for existence and/or permissions.

Cannot post Color LUTs to device [device]. Check device for
existence and/or permissions.

Cannot get monitor mode from device [device]. Check device
for existence and/or permissions.

Cannot set diagnostic mode from device [device]. Check
device for existence and/or permissions.

Cannot set monitor mode from device [device]. Check device
for existence and/or permissions.

Cannot create raster for device [device]. Check device for
existence and/or permissions.

Cannot create color map for device [device]. Check device
for existence and/or permissions.

Cannot create context for device [device]. Check device for
existence and/or permissions.

Cannot create color translation object for device [device].
Check device for existence and/or permissions.

Cannot create path object for device [device]. Check device
for existence and/or permissions.

Cannot create child raster for device [device]. Check
device for existence and/or permissions.

Cannot create multiple plane group information for device
[device]. Check device for existence and/or permissions.

Software error. The device that you specified (the default is /dev/fbs/leo0) may not be available to the test, therefore the above operation cannot be performed on this device. Make sure that you are executing the test on a machine with a ZX, and that you have permission to access it, and the device is not being used by another application.
Cannot start another process. Software error.
  Software error. The process table maybe full and the SPARCstation may
  have to be rebooted.

Cannot grab mouse or keyboard because [reason]. May need to
bring down other graphic software that is currently running
same window server.
  Software error. When the FB locking option is selected, leotest also tries
  to lock the mouse and keyboard but not successful in doing so. The reason
  can be one of the followings, according the window system software:

 mouse/keyboard is frozen

 grab window is not viewable

 grabbed at invalid time

 already grabbed by another client

CLUT #n, index #, color [color], expected 0x#, observed
0x#, XOR=0x#

An error was found in one the three color look up tables tested by SunDiag. The error was found in the nth CLUT. The index is out of 256 entries in each CLUT. Each CLUT has eight bits value each for red, green, and blue. The color indicates in which set of eight bits the error was found. The test expected to find expected but received observed, yielding XOR when the two values are exclusive or'd with each other.
Data file [filename] missing in the current test directory.

  Software error. ZX SunDiag can't find the data file (leotest.data) in the
  current /opt/SUNWdiag/bin directory. May have to reinstall the
  SUNWdiag package in the specified directory.

Error in [subtest] test.

The subtest fails and the cause is given in the following message.
Error in verifying the [Red/Green/Blue] plane at x=#,
y=#,bank=#, expected=0x#,observed=0x#, XOR=0x#.
  Failed accelerator port test. The error is in either the Red, Green, or Blue
  image plane. The x-y coordinate of the pixel should contain expected value
  but observed value is received instead, yielding XOR value, or the bits in
  error, when the two values are exclusive or'd with each other.

Failed to open data file [filename]. Suspect incomplete or
incorrect hardware installation. Files may also have been
corrupted.
  Indicates a software initialization problem. [filename] is the data file that
  SunDiag can't open.

Failed to read data file [filename]. Suspect incomplete or
incorrect hardware installation. Files may also have been
corrupted.
  Indicates a software initialization problem. [filename] is the data file that
  SunDiag can't read.

Illegal SBus DVMA code = 0x%x addr = 0x%x data= 0x%x. Maybe
data file is corrupted.

Illegal SBus packet, code = 0x%x addr = 0x%x data = 0x%x.
Maybe data file is corrupted.

This error occurs while the subtest is reading the transaction file. It is likely that the data file is corrupted, so the SUNWdiag package may need to be re-installed.
Out of Memory.
  Out of memory error. Increase swap space and/or kill other processes.

Pick Detect misses:%d lines and/or triangles inside the
pickbox and/or %d lines and triangles outside the pickbox.

Failed the Picking accelerator port test. Only the failing component (RED, GREEN, or BLUE) appears in the message.
Pick Echo failed: *** Error(s) found in [RED], [GREEN],
[BLUE} components.
  Failed the Picking accelerator port test. Only the failing component (RED,
  GREEN, or BLUE) appears in the message.

Picking: *** Error(s) found in [RED], [GREEN], [BLUE}
components.
  Failed the picking accelerator port test. Only the failing component (RED,
  GREEN, or BLUE) appears in the message.

[Plane group name] Pixel Access Mode error at x=# y=#,
bank=#, expected=0x#,observed=0x#, XOR=0x#.

The direct port video memory test has found an error at pixel (x,y) in the named plane group. Pixel Access Mode applies to all plane groups that access the frame buffer memory four bytes at a time. (In other words, all planes except eight bit planes). The memory for the pixel resides in the given VRAM bank. The test expected to find expected but observed observed, yielding XOR when the two values are exclusive or'd with each other.
SRAM checksum mismatch. Float #1 = 0x#, Float #2 = 0x#,
Float #3 = 0x#, Float #4 = 0x#.
  All four checksums of the SRAMs in the Floating Point Transform section
  are not identical. The subtest displays the mismatch checksum from each
  SRAM of each LeoFloat chip.

SRAM of the LeoFloat [0/1/2/3], number of failures = #,
first SRAM location = #, expected = 0x#, observed = 0x#,
XOR = 0x#

An error is found in the SRAM test of the LeoFloat chip number 0, 1, 2, or 3. If the number of failures is more than 1, the subtest display the first SRAM location that fails, the expected and observed values in this location, and the bits in error (values of expected and observed are xor'd together).
'tar' never finished. System software problem.

Software error. Make sure that the tar program is installed correctly on your system. Also, use df to see if you have enough disk space left in your /tmp directory.
tar: [error]

Software error. Make sure that the tar program is installed correctly on your system. Also, use df to see if you have enough disk space left in your /tmp directory.
TAR failed. Note: A space of approximately 2MB in /tmp is
required for the test to run correctly.
  Software error. The tar program cannot unpack data file to the /tmp
  directory because of not enough disk space.

The checksums for [red/green/blue] image data of all pixels
don't match, expected = 0x#, observed = 0x#, XOR = 0x#

The FB output section subtest prints out this message when the checksums of either red, green, or blue image data observed from the trap registers in the Video Output test are not the same as expected values. It also prints out the error messages below if the upper four bits in the trap registers are not set/reset as expected,
The Even Field bit expected to be 0, observed 1.

The Composite Sync bit expected to be 1, observed 0.

The Composite Blank field expected to be 1, observed 0.

The Stereo bit expected to be 1, observed 0.

The Stereo bit expected to be 1, observed 0.

Either these bits are not set correctly or the read is from wrong location, which indicates there is an error in the Video Output section.
Unable to map (access) [device]. Not enough memory.

Software error. Cannot map the addresses for the ZX device (default /dev/fbs/leo0) because of not enough memory. May have to increase swap space or add more memory.
Unable to open device [device]. Check device for existence
and/or permission.

Software error. SunDiag is unable to open the ZX device. Make sure that /dev/fbs/leo0 exists and that the permissions are correct. There may be a software installation problem in which the ZX software packages need to be re-installed.
Uncompression of data file failed. Note: A space of
approximately 2MB in /tmp is required for the test to run
correctly
  Software error. Not enough disk space in /tmp, about 2 Megabytes to
  uncompress data file. You may have to remove unneeded files or link /tmp
  to a bigger disk partition.

Unknown data file magic number = 0x#.
  Software error. The data file was generated by an older version of software
  tools. Report this error by filing a bug report or calling the Sun 800 number.

Unsupported 24-bit data length. Maybe data file is
corrupted.

This error occurs while the subtest is reading the transaction file. It is likely that the data file is corrupted, so the SUNWdiag package may need to be re-installed.
Unable to open display. Window server not running.

Warning message only. This message is displayed when the ZX SunDiag is executed from the command line remotely or if SunDiag is run in TTY mode.
vfork: [error]
  Software error. An error has occurred while trying to fork a child process.
  Increase swap space, or close other running processes.

[PWID/QWID] WLUT: Look up table error at index #, expected
0x#, observed 0x#, XOR 0x#.

An error was found in either PWID (Hardware Window ID) or QWID (Software Window ID) look up tables tested by SunDiag. The error was found in the nth WLUT. The index is out of 64 entries for PWID or 15 for
QWID. The test expected to find expected but received observed, yielding XOR when the two values are exclusive or'd with each other, which indicates the bits in error. This error message indicates there is an error in the Video Output section.

3.7 NeWSprinter Test (spdtest)

3.7.1 spdtest Description

The spdtest is a two part test that checks the printer support hardware. The first part is a register test that checks the NeWSprinter(TM) 20 SBus printer card's internal functions. The second part is a printing test that checks the interaction between the printer and the print server, as well as the printer's own capabilities.

3.7.2 spdtest Options

Grafik

Figure 3-7

Functional Test The Functional test is composed of two subtests. The first subtest is the Register test that checks the NeWSprinter 20 SBus printer card. The second subtest is the Printing subtest, which tests the printer's capabilities.
The default setting is Register.
Resolution This exclusive setting defines the printer resolution of the printer test pattern. You can choose either 300 or 400 dots per inch.
The default setting is 300 dots per inch.
Tray From the Tray menu, you can choose from five different types of paper cassettes:
  • Main Tray (or Tray 1) is the top cassette that feeds paper to the printer.
  • Tray 2 is the bottom cassette that feeds paper to the printer.
  • Tray 3 is an optional tray.
  • Manual Tray is a manual feed tray connected to the rear of the printer. This tray is used to hand-feed print media which cannot be accommodated by the paper cassettes.
  • Auxiliary Feeder is optionally installed in place of the manual feed tray. The Feeder stores and automatically feeds print media that would otherwise require the manual feed.
The default setting is the Main tray.
Mode From the Mode menu, you can set the interval between image printings. The choices are:
  • Fast prints an image every 10 seconds.
  • Medium prints an image every 12 minutes.
  • Extended prints an image every 30 minutes.
The default setting is Fast.
Image This option allows you to enter the filename of the test image to print.

3.7.3 spdtest Command Line Syntax

/opt/SUNWdiag/bin/spdtest F=function D=devicename L=loop R=resolution I=image
T=tray M=mode

Arguments
F=functionThe function value represents one of the following functional tests:

0 = Register test

1 = Printing test

D=devicenameThe full pathname of the device must be substituted for devicename.
L=loopSubstitute Loop for the number of times you want to run the test.
R=resolutionReplace resolution with a number representing the printer resolution:

0 = 300 dpi

1 = 400 dpi

I=imageReplace image with the name of a rasterfile.
T=trayThe tray number represents the type of printer cassette the
printer uses:
0 = Main tray (Tray 1)
1 = Tray 2
2 = Tray 3 (optional)
3 = Manual Tray
4 = Auxiliary Feeder (optional)
M=modeThe mode number represents how often to print the test image:

0 = Fast (Prints an image every 10 seconds) 1 = Medium (Prints an image every 12 minutes) 2 = Extended (Prints an image every 30 minutes)

3.8 SunVideo Test (rtvctest)

The rtvctest verifies the functionality of the SunVideo(TM) SBus card. SunVideo technology captures and compresses video input in real-time, making it possible to have real-time video conferencing over standard Ethernet networks.

3.8.1 rtvctest Test Description

The rtvctest is divided into four sub-tests: PROMCheck, memory, Jalapeno, and CL4000. The PROMCheck sub-test verifies the SunVideo card's programmable read only memory. The memory test verifies all of the memory on the card, including the 2 Mbytes of memory on the CL4000 compression engine and the memory on the Jalapeno application-specific integrated circuit (ASIC). The Jalapeno sub-test verifies the interface logic between the SBus, A/D conversion chips, and the CL4000 compression engine. The CL400 sub-test verifies that the compression engine ASIC is able to compress digitized video data from the A/D chips and send this data to the SBus, through the Jalapeno ASIC.
The rtvctest is composed of 49 verification test modules. Table 3-3 lists these modules and their associated test sequence numbers.
Table 3-3 rtvctest
SunVideo Verification Module NameTest Sequence Number
RTVC SUNDIAG Start0
RTVC Checksum1
RTVC Jalapeno SMEM2
RTVC CL4000 DMEM3
RTVC Jalapeno SBus Interrupt Mask4
RTVC CL4000 Interrupt Mask5
RTVC DVMA Control Register6
RTVC DVMA Transfer Size Counter7
RTVC DVMA Memory Address Counter8
RTVC DVMA Virtual Memory Address Counter9
RTVC DVMA Slave SBus Rerun Register10
Table 3-3 rtvctest(Continued)
SunVideo Verification Module NameTest Sequence Number
RTVC IIC Control Register11
RTVC IIC Data Register12
RTVC Video DMA Control Register13
RTVC Video DMA Transfer Size Counter14
RTVC Video DMA Memory Address Counter15
RTVC User Interrupt 016
RTVC User Interrupt 117
RTVC User Interrupt 218
RTVC User Interrupt 319
RTVC Video Control and Status Register20
RTVC Video Control Field Line Interrupt 121
RTVC Video Control Field Line Interrupt 222
RTVC Video Scan Line Mask Registers23
RTVC Video Input Format Type25
RTVC Video Horizontal Lock26
RTVC Video Even Odd Field27
RTVC CL4000 Host Control28
RTVC CL4000 Host Lock29
RTVC CL4000 Video Port A Control30
RTVC CL4000 Video Port B Control31
RTVC CL4000 Video Port A FIFO32
RTVC CL4000 Video Port B FIFO33
RTVC CL4000 Address Memory Registers34
RTVC CL4000 Instruction Memory Access Registers35
RTVC Time Stamp Register36
RTVC CL4000 Register Memory37
RTVC CL4000 Scratch Memory38
Table 3-3 rtvctest(Continued)
SunVideo Verification Module NameTest Sequence Number
RTVC CL4000 DMA Mode39
RTVC CL4000 Motion Estimation Registers40
RTVC CL4000 PSW41
RTVC CL4000 Variable Length Coder Registers42
RTVC CL4000 Channel Memory Registers43
RTVC CL4000 CPU Control44
RTVC CL4000 Multiply Control45
RTVC CL4000 DMA Interrupt Control46
RTVC CL4000 Block Transfer Mode47
RTVC CL4000 Accumulator MSB48
RTVC CL4000 JPC Field49
RTVC SUNDIAG Finish50

3.8.2 rtvctest Options

Grafik

Figure 3-8 rtvctest

You may test the SunVideo card without any video device (camera, video disc player, or VCR) connected to a input port. However, if you connect a video device to the card, then you must state the format of the video source and the input port which the device is connected.

Note - If you do not state both the video source and the input port, the rtvctest will print an error and terminate testing.

Source Format Select the format of the video source used for testing. You may select from the following sources:
Video SourceDefinition
NoneNo video source.
NTSCA National Television System Committee (NTSC) video source, which is the video standard in the United States and Japan.
PALA phase alternate line video source, which is the video standard in Europe.
Ports If you have selected a video source for testing, then you must state which input port you have used to connect the source to the SunVideo card. You may select from the following ports:
Input PortDefinition
NoneNo input port used.
CV1The Composite Video Input Port 1 (RCA type input).
CV2The Composite Video Input Port 2 (RCA type input).
SVHSThe Super VHS input port.

3.8.3 rtvctest Command Line Syntax

/opt/SUNWdiag/bin/rtvctest [ntsc|pal] [cv1|cv2|svhs] D=rtvc_device

Arguments
[ntsc|pal]Select the format of the video source used for testing. Select either ntsc (video standard in the United States and Japan) or pal (video standard in Europe).
[cv1|cv2|svhs]If you have selected a video source for testing, then you must state which input port you have used to connect the source to the SunVideo card. You may select from the following ports:

cv1 Composite video input port 1 (RCA type) cv2 Composite video input port 2 (RCA type) svhs Super VHS port

D=rtvc_deviceYou are required to state the SunVideo device when running the rtvctest from the command line. Replace rtvc_device with rtvcn, where n is the device number (from 0 to 31) of the SunVideo card under test.

3.8.4 rtvctest Quick Test Description

Running this test in quick mode abbreviates the test procedure. The quick mode test performs a subset of the available test modules, which should provide a quicker check of the SunVideo hardware.

3.8.5 rtvctest Error Messages

SunVideo Error Message #10
%s
Where:
%s is one of the following message:
Missing REQUIRED argument D=rtvc[0..31]

SunVideo Error Message #20
%s Error # %d

Where:
%s is one of the following message:
     ioctl RTVC_CMD_RESET fault
     ioctl RTVC_CMD_SET_VIDEO fault
     ioctl RTVC_CMD_GET_VIDEO fault
     open /dev/rtvc fault
     close /dev/rtvc fault
     open /dev/rtvcctl fault
     close /dev/rtvcctl fault
     Unknown Jalapeno Version

%d is one of the following number:
ioctl error
module version

SunVideo Error Message #30
%s1 %s2 Error # %d

Where:
%s1 is one of the following message:
        memory map fault for
        memory unmap fault for
        selected /dev/rtvc and /dev/rtvcc1 not available

%s2 is one of the following message:
        prom
        sram
        buses
        reset
        dmem
        rtvc
  %d is the error number

SunVideo Error Message #40
RTVC Fault Detected via module %s1
Physical Address %X Expected Value %X Actual Value %X
RTVC Sundiag Module number %d
Location %s2
Message: %s3

Where:
%s1 is the name of the module under test
%X are the values associated with physical address, expected value, actual value
%d is the Sundiag Module under test
%s2 is the U location of the faulty component
%s3 are any additional messages
SunVideo Error Message #41
RTVC Fault Detected via module %s

Where:
%s is the name of the module under test
SunVideo Error Message #42
%s1 %X1 %s2 %X2
Where:
%s1 is one of the following message:
Video Format Expected
Video Port Expected

%X1 is the expected value
%s2 is one of the following message:
Actual

%X2 is the actual value
SunVideo Error Message #50
%s %d
Where:
%s is one of the following message:
Unknown RTVC CL4000 test module
Unknown RTVC Jalapeno test module
Unknown RTVC test module
Unknown RTVC memory test module
Unknown Start Bit

%d is the module number or start bit location
RTVC Verbose Information #10
%s
Where:
%s is one of the following message:
Video Format OR Port NOT Selected - Test Skipped
Probe module : NOT XQT under SUNDIAG
Probe module : XQT under SUNDIAG

RTVC Verbose Information #20
%s1 %s2 Status %X
Where:
%s1 is one of the following message:
     Finished
     Started

%s2 is one of the following message:
Module Name
Sundiag
Walking One
Walking Zero
Data Line
Address Line
Stuck At Fault
Modulus 3
Read Write Collision

%X is fault detected flag
RTVC Verbose Information #30
Executing module %d %s

Where:
%d is the test module number %s is the test module name

3.9 PCMCIA Modem Card Test (pcmciatest)

This test verifies the functionality of the PCMCIA Modem Card.

3.9.1 pcmciatest Test Description

The pcmciatest issues a series of commands to the modem which instructs the modem's firmware to run an internal analog loopback diagnostic test. Upon completion, the firmware sends back a three digit status message indicating whether the test passed or failed.
As an option, the pcmciatest will test socket I/O cards. This test will write an 8 Kbyte incrementing data pattern to the I/O card which is then looped back, read, and verified.

Note - When testing socket I/O cards, a 9-pin loopback connector is required. However, no loopback connector is required when testing the default modem card. See Appendix A, "Loopback Connectors," for loopback connector wiring instructions.

3.9.2 pcmciatest Options

Grafik

Figure 3-9 pmciatest

The default card type for each PCMCIA slot is a modem card. If only one modem card is plugged in, the empty slot will be ignored.
From the pcmciatest Option Window, you can choose to test socket I/O cards. To test a socket card, choose socket on the Card Type switch. If you choose to test a socket I/O card in an empty slot, the test will fail.
Any combination of modem and socket I/O cards may be placed in the PCMCIA slots. However, you must select the correct type of card in the Option Window. If you select an incorrect card type, the test will fail.

3.9.3 pcmciatest Command Line Syntax

/opt/SUNWdiag/bin/pcmciatest o=card_type t=card_type

Arguments
o=card_typeSpecify the card type for slot 1 (o is short for "one"). card_type is the type of card in slot 1. Type o=s if there is a socket I/O card in slot 1.

If there is a modem card in slot 1, then you do not need to specify this argument.

t=card_typeSpecify the card type for slot 2 (t is short for "two"). card_type is the type of card in slot 1. Type t=s if there is a socket I/O card in slot 2.

If there is a modem card in slot 2, then this argument is not needed.

3.10 Infrared Interface Test (irtest)

The irtest tests the SPARCstation Voyager(TM) system's infrared (IR) interface.

3.10.1 irtest Test Description

The irtest is a two part test: a loopback test and an IR transmit test. In the loopback test, the irtest will send and receive an 8 Kbyte incrementing data pattern through an internal loopback within the Multi-Interface Chip's (MIC) Serial Communication Controller (SCC).
In the second part of the test, the irtest will enable the IR transmitter and receiver. The IR mode will be set to PULSE and the baud rate will be set to 115200. The test will then send the same 8 Kbyte data stream (broken up into 64 byte blocks) out the transmitter, allowing each byte to be detected and read by the receiver. The test will be repeated with the receiver disabled to make sure that the receiver does not pick up any data coming out of the transmitter

Note - The 8 Kbyte data is broken up into 64 byte blocks because this block size is the maximum amount of data that can be transmitted through the IR interface without errors.

Currently, only the PULSE mode is tested by the irtest. The error rate for HIGH mode is too high to permit this type of IR loopback testing.

3.10.2 irtest Options

Grafik

Figure 3-10 irtest

The irtest currently has no options.

3.10.3 irtest Command Line Syntax

/opt/SUNWdiag/bin/irtest

3.11 SPARCstorage Array Controller Test (plntest)

The plntest test checks the controller board on the SPARCstorage(TM) Array.

3.11.1 plntest Test Description

The SPARCstorage Array (SSA) is a large disk storage I/O subsystem capable of housing up to 30 SCSI hard drives. The SSA communicates with a host system over a fiber optic link provided by an SBus-based host adapter card in the host system and the corresponding SSA Controller board hardware.
The SSA Controller card is an intelligent, CPU-based board with its own memory and ROM-resident software. In addition to providing a communications link to the disk drives, it also buffers data, between the host system and disk drives, in its non-volatile RAM (NVRAM). In order for data to go from the host to a particular disk, it must first be successfully transferred to this NVRAM space.
To perform this data transfer operation, the host machine, SBus host adapter card, fiber-channel connection, and the SSA controller board must be working properly. It is precisely this operation that plntest tries to stress and verify. By stressing this operation, plntest can isolate failures on the SSA disk drives from failures on the SSA Controller board.

Note - fstest and rawtest will transfer data on the SSA disk drives over the same path mentioned above. However, they will not be issuing these data transfers as quickly as plntest can.

plntest Stress Test The plntest attempts to stress the SPARCstorage Array hardware and software by issuing a large number of transfers between the host system and the SSA controller board.
The plntest exercises the hardware and software by invoking many SCSI read buffer and write buffer commands, of various sizes and data patterns, to the NVRAM. These operations exercise the host fiber channel hardware, the SSA fiber channel hardware, the SSA resident management software (PMF), and the hardware component interaction on the SSA controller card (all components except the SCSI ones).

3.11.2 plntest Options

Grafik

Figure 3-11 plntest

Configurations The Configuration area lists the names of all the logical disk drives (both single and grouped) that are attached to the SSA controller board.

Note - If no disks are present, the window will display "none" under the Attached Disks heading.

Plntest Mode By default, plntest is run in read-only mode, in which the test simply reads blocks of memory from the SSA controller.
Click on the Write/Read choice to enable the Write/Read test mode. In Write/Read mode, plntest writes data (as specified by the Pattern option below) to the SSA controller memory. This data is then read back and compared.
Plntest Pattern The Pattern option allows you to specify the exact data pattern that will be written to the SSA memory. The data pattern choices are: 0's. 1's, 5's, a's, and Random. Random is the default data pattern.
Plntest Buffer Size The Buffer size determines the size of the data transfers between the SSA controller card and the host system. The buffer size choices are: 1, 2, 5, 10, 50, 100, 200, 500, or Random Kbytes. The default Random size selects buffer sizes between 1 and 500 Kbytes per transfer.

Note - plntest is not a scalable test.

3.11.3 plntest Command Arguments

/opt/SUNWdiag/bin/plntest ? D=device_name x W P=pattern B=buffer_size Kb
standard_arguments

Arguments
?Probes the system for valid SSA Controller devices and prints them
to screen (see Section 3.11.3.1, "Probing for SSA Controller Devices.")
D=device_nameThe physical pathname of the SSA controller card to be tested. This argument must be included when running plntest from the command line, unless the ? argument is used.
Arguments(Continued)
xProbes the specified SSA controller card for the single and grouped disks attached to the controller card, and prints their logical names to the screen.

Note: The D=device_name must be specified for this option to work.

WInvoke the test in Write/Read mode. The default mode is read-only. Note: The D=device_name must be specified for this option to work.
P=patternChoose the data pattern used in Write/Read mode. Choose one of
the following data patterns:
a all A's (hexadecimal)
0 all 0's
1 all 1's
5 all 5's
r Random
Note: The D=device_name and W arguments must be specified to make
this option work.
B=buffer_size KbSize of the buffer, in Kbytes, that will be transferred to and from the host per test iteration. The buffer size can range from 1 to 500 Kbytes, or r for random (default).

Note: The D=device_name must be specified for this option to work.

3.11.3.1 Probing for SSA Controller Devices

Unlike most other hardware devices, the SSA controller card has not yet been assigned a logical device name (one you would find in the /dev directory). Therefore, the SSA controller card is identified by its longer, physical device name.
When running plntest from the command line, the physical device name of the SSA controller card must be specified. To avoid typing the long physical device name, use the ? option. The ? option will probe the system and print out the physical paths of all the attached SSA controller devices.
If you are going to invoke plntest from the command line often, it may become bothersome to type the physical device name each time. However, you can create your own logical name and link it to the physical name. You will then be able to invoke plntest with the shorter logical name.

  machine# ./plntest "?"  
  
  1: /devices/io-unit@f,e3200000/sbi@0,0/SUNW,soc@1,0/SUNW,pln@0c0d,0e0f0102:ctlr  
  2: /devices/io-unit@f,e0200000/sbi@0,0/SUNW,soc@3,0/SUNW,pln@0c0d,0e0f0102:ctlr  
  
  machine# ln -s \  
  /devices/io-unit@f,e3200000/sbi@0,0/SUNW,soc@1,0/SUNW,pln@0c0d,0e0f0102:ctlr \  
  /dev/ssa1  
  machine# /opt/SUNWdiag/bin/plntest D=/dev/ssa1  

3.11.4 plntest Quick Test Description

In quick test mode, the plntest will limit itself to 500 data transfers between the host and the SSA.

3.11.5 plntest .usertest File Command Line

The following is a sample .usertest command:

   pln0, plntest, D=/dev/pluto0 W P=r B=r  

3.11.6 plntest Error Messages

Unable to determine physical pathname for %s
Error in Closing device: %d
Error. Data Mismatch in Controller Memory
Error in validating device name
Can't open /dev/dsk directory

Invalid device name
No Pluto Controller device specified.  Use 'D=' option
No Pluto Controller devices found
No disks found on this Pluto Controller
Error in Opening device: %d
Error trying to probe device: %d
USCSI Read Buffer Error. USCSI ioctl() return %d
SCSI command to pln:ctlr failed. status = 0x%x
USCSI ioctl error. ioctl() return %d
USCSI Write Buffer Error. USCSI ioctl() return %d